Microscopy
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Microscopes |
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| Carl Zeiss – Axio A1m Imager
Light microscope |
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| Carl Zeiss – Axio M1m Imager
Light microscope with quantitative image analysis for optical characterization |
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| Carl Zeiss – SteREO
Stereo microscope for three-dimensional surface characterization |
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| FEI – Helios NanoLab 600i FIB Workstation
High-resolution scanning electron microscope with field emission source and integrated FIB technique for in-situ sample preparation |
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| Large-chamber scanning electron microscope
In-situ observation of deformation and failure analysis of large parts |
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| Olympus – Lext OLS 4000
Laser measuring microscope for contactless surface characterization |
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| NT-MDT – Solver Pro SPM Platform
Topological characterization of nano-scaled materials |
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